Qualcomm ≫ Qcn9012 Firmware

Transient DOS while parsing ESP IE from beacon/probe response frame.

Transient DOS while parsing fragments of MBSSID IE from beacon frame.

Transient DOS while parsing the MBSSID IE from the beacons, when the MBSSID IE length is zero.

Transient DOS while importing a PKCS#8-encoded RSA key with zero bytes modulus.

Memory corruption when keymaster operation imports a shared key.

Memory corruption when IOMMU unmap operation fails, the DMA and anon buffers are getting released.

Memory corruption when an invoke call and a TEE call are bound for the same trusted application.

Memory corruption when allocating and accessing an entry in an SMEM partition.

Memory corruption while performing finish HMAC operation when context is freed by keymaster.

Transient DOS while loading the TA ELF file.