Qualcomm ≫ Wcn7861 Firmware

Transient DOS while parsing the EPTM test control message to get the test pattern.

Transient DOS while handling command data during power control processing.

Transient DOS while processing power control requests with invalid antenna or stream values.

Memory corruption while handling invalid inputs in application info setup.

Memory corruption due to global buffer overflow when a test command uses an invalid payload type.

memory corruption while loading a PIL authenticated VM, when authenticated VM image is loaded without maintaining cache coherency.

Information disclosure while running video usecase having rogue firmware.

Memory corruption while selecting the PLMN from SOR failed list.

Information disclosure when UE receives the RTP packet from the network, while decoding and reassembling the fragments from RTP packet.

Information disclosure while decoding RTP packet received by UE from the network, when payload length mentioned is greater than the available buffer length.