Qualcomm ≫ Fastconnect 7800 Firmware

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7.5

CVE-2025-47318

Transient DOS while parsing the EPTM test control message to get the test pattern.

7.5

Transient DOS while handling command data during power control processing.

7.8

Memory corruption while encoding the image data.

7.5

Transient DOS while processing power control requests with invalid antenna or stream values.

7.8

Memory corruption while handling invalid inputs in application info setup.

7.8

Memory corruption while processing config_dev IOCTL when camera kernel driver drops its reference to CPU buffers.

7.8

Memory corruption due to double free when multiple threads race to set the timestamp store.

7.8

Memory corruption due to global buffer overflow when a test command uses an invalid payload type.

7.8

memory corruption while loading a PIL authenticated VM, when authenticated VM image is loaded without maintaining cache coherency.

9.8

Memory corruption while selecting the PLMN from SOR failed list.