Qualcomm ≫ Wcd9395 Firmware

Memory corruption while reading secure file.

Memory corruption while handling multiple IOCTL calls from userspace to operate DMA operations.

Transient DOS may occur while parsing SSID in action frames.

Memory corruption may occur while initiating two IOCTL calls simultaneously to create processes from two different threads.

Transient DOS may occur while parsing extended IE in beacon.

Transient DOS may occur while parsing EHT operation IE or EHT capability IE.

Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.

Memory corruption occurs while connecting a STA to an AP and initiating an ADD TS request.

Memory corruption while processing multiple IOCTL calls from HLOS to DSP.

Memory corruption can occur when TME processes addresses from TZ and MPSS requests without proper validation.