6.6
CVE-2024-53017
- EPSS 0.03%
- Veröffentlicht 03.06.2025 05:52:50
- Zuletzt bearbeitet 20.08.2025 20:24:55
- Quelle product-security@qualcomm.com
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Memory corruption while handling test pattern generator IOCTL command.
Daten sind bereitgestellt durch National Vulnerability Database (NVD)
Qualcomm ≫ Sdm429w Firmware Version-
Qualcomm ≫ Snapdragon 429 Mobile Platform Firmware Version-
Qualcomm ≫ Wcn3620 Firmware Version-
Qualcomm ≫ Wcn3660b Firmware Version-
Zu dieser CVE wurde keine CISA KEV oder CERT.AT-Warnung gefunden.
| Typ | Quelle | Score | Percentile |
|---|---|---|---|
| EPSS | FIRST.org | 0.03% | 0.054 |
| Quelle | Base Score | Exploit Score | Impact Score | Vector String |
|---|---|---|---|---|
| product-security@qualcomm.com | 6.6 | 1.8 | 4.7 |
CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:L/I:H/A:L
|
CWE-823 Use of Out-of-range Pointer Offset
The product performs pointer arithmetic on a valid pointer, but it uses an offset that can point outside of the intended range of valid memory locations for the resulting pointer.