CVE-2019-20607

EPSS 0.88%
Veröffentlicht 24.03.2020 20:15:13
Zuletzt bearbeitet 21.11.2024 04:38:51
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An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).

Betroffene Produkte Warnungen 0 Metriken 3 CWE 1 Referenzen 4

NVD 7 VulnDex Vulnerability Enrichment 0

Daten sind bereitgestellt durch National Vulnerability Database (NVD)

Google ≫ Android Version 7.0

   Qualcomm ≫ Msm8996 Version -
   Qualcomm ≫ Msm8998 Version -
   Samsung ≫ Exynos 7420 Version -
   Samsung ≫ Exynos 7870 Version -
   Samsung ≫ Exynos 8890 Version -
   Samsung ≫ Exynos 8895 Version -

Google ≫ Android Version 7.1.0

Google ≫ Android Version 7.1.1

Google ≫ Android Version 7.1.2

Google ≫ Android Version 8.0

Google ≫ Android Version 8.1

Google ≫ Android Version 9.0

Zu dieser CVE wurde keine Warnung gefunden.

EPSS Metriken
Typ	Quelle	Score	Percentile
EPSS	FIRST.org	0.88%	0.544

CVSS Metriken
Quelle	Base Score	Exploit Score	Impact Score	Vector String
NIST	9.8	3.9	5.9	CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H
NIST	10	10	10	AV:N/AC:L/Au:N/C:C/I:C/A:C

CWE-787 Out-of-bounds Write

The product writes data past the end, or before the beginning, of the intended buffer.

https://security.samsungmobile.com/securityUpdate.smsb

Vendor Advisory

https://nvd.nist.gov/vuln/detail/CVE-2019-20607

CVE Source (NVD)

https://cveawg.mitre.org/api/cve/CVE-2019-20607

CVE Source (JSON)

https://euvd.enisa.europa.eu/vulnerability/CVE-2019-20607

EUVD

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CVE-2019-20607