Qualcomm ≫ Wcd9370 Firmware

Memory corruption may occur during IO configuration processing when the IO port count is invalid.

Memory corruption during concurrent access to server info object due to incorrect reference count update.

Memory corruption during concurrent access to server info object due to unprotected critical field.

Transient DOS may occur while parsing SSID in action frames.

Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.

Memory corruption when IOCTL call is invoked from user-space to write board data to WLAN driver.

Memory corruption may occur while reading board data via IOCTL call when the WLAN driver copies the content to the provided output buffer.

Memory corruption while IOCTL call is invoked from user-space to read board data.

Transient DOS may occur while parsing EHT operation IE or EHT capability IE.

Transient DOS while connecting STA to AP and initiating ADD TS request from AP to establish TSpec session.