7.8

CVE-2022-35858

Exploit

EPSS 0.05%
Veröffentlicht 04.08.2022 20:15:20
Zuletzt bearbeitet 21.11.2024 07:11:49
Quelle cve@mitre.org
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The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.

Betroffene Produkte Warnungen 0 Metriken 2 CWE 1 Referenzen 5

NVD 1 VulnDex Vulnerability Enrichment 0

Daten sind bereitgestellt durch National Vulnerability Database (NVD)

Samsung ≫ Mtower Version0.3.0

Zu dieser CVE wurde keine Warnung gefunden.

EPSS Metriken
Typ	Quelle	Score	Percentile
EPSS	FIRST.org	0.05%	0.165

CVSS Metriken
Quelle	Base Score	Exploit Score	Impact Score	Vector String
nvd@nist.gov	7.8	1.8	5.9	CVSS:3.1/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H

CWE-401 Missing Release of Memory after Effective Lifetime

The product does not sufficiently track and release allocated memory after it has been used, which slowly consumes remaining memory.

https://github.com/Samsung/mTower/blob/18f4b592a8a973ce5972f4e2658ea0f6e3686284/tee/lib/libutee/tee_api_objects.c#L283

Third Party Advisory

Exploit

https://github.com/Samsung/mTower/issues/71

Third Party Advisory

https://nvd.nist.gov/vuln/detail/CVE-2022-35858

CVE Source (NVD)

https://cveawg.mitre.org/api/cve/CVE-2022-35858

CVE Source (JSON)

https://euvd.enisa.europa.eu/vulnerability/CVE-2022-35858

EUVD